Electron and Scanning Probe Microscopy
The Electron and Scanning Probe Microscopy Unit provides solutions for imaging and analysis at the nanoscale (from the micron down to the angstrom range). The facility is managed by Dr Sean Davis, supported by two full-time technicians, Mr Jonathan Jones and Dr Andrew Collins.
For enquiries regarding the submission of samples for service measurements, training or for an introductory tour of the EM/SPM Unit please e-mail:chem-emu@sympa.bristol.ac.uk.
Electron Microscopy Equipment Details
- JEOL 200 Kv Hi Resolution TEM 2011
- JEOL 120 Kv 1200 Mk1 TEM
- JEOL 120 Kv 1200 Mk2 TEM
- JEOL SEM 5600 LV
- JEOL Field Emission Gun SEM 6330
Electron Microscopy Accessories
- Vacuum coating (C and Pt/Pd, Au)
- Ultramicrotomy
- Critical point drying and freeze-drying
- Cryo stage for TEM
Scanning Probe Microscopy Equipment Details
- Bruker Multimode with Quadrexed Nanoscope 3D controller
- Bruker Multimode with Nanoscope V controller with Picoforce Extender
- Fully trained full-time SPM technician
- Basic and advance training on all modes
- Self or contract service work available by arrangement
- More information can be found on the SPM website
